BS EN 62496-2:2017
$189.07
Optical circuit boards. Basic test and measurement procedures – General guidance for definition of measurement conditions for optical characteristics of optical circuit boards
Published By | Publication Date | Number of Pages |
BSI | 2017 | 46 |
IEC 62496-2:2017 specifies a method of defining the conditions for measurements of optical characteristics of optical circuit boards. The method comprises the use of code reference look-up tables to identify different critical aspects of the measurement environment. The values extracted from the tables are used to construct a measurement identification code, which, in itself, captures sufficient information about the measurement conditions, so as to ensure consistency of independently measured results within an acceptable margin. Recommended measurement conditions are specified to minimise further variation in independently measured results.
PDF Catalog
PDF Pages | PDF Title |
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2 | National foreword |
5 | Annex ZA(normative)Normative references to international publicationswith their corresponding European publications |
7 | CONTENTS |
9 | FOREWORD |
11 | INTRODUCTION Figures Figure 1 – Optical circuit board varieties |
12 | 1 Scope 2 Normative references 3 Terms and definitions |
14 | 4 Measurement definition system for optical circuit boards 4.1 General 4.2 Measurement definition system requirements 4.2.1 Accuracy 4.2.2 Accountability |
15 | 4.2.3 Efficiency 4.2.4 Convenience 4.2.5 Independent 4.2.6 Scalable 4.2.7 Customised requirements 4.2.8 Prioritised structure 4.3 Measurement definition criteria 4.3.1 General |
16 | 4.3.2 Source characteristics 4.3.3 Launch conditions |
17 | Tables Table 1 – Recommended modal launch profiles |
18 | Figure 2 – Recommended test setup for single-mode fibre launch conditions Figure 3 – Recommended test setup for multimode fibre launch conditions |
19 | 4.3.4 Input coupling conditions |
20 | 4.3.5 Output coupling conditions Figure 4 – Cross-sectional views of channel under test at input |
21 | 4.3.6 Capturing conditions 4.4 Launch and capturing position Figure 5 – Cross-sectional views of the channel under test at output |
22 | 4.5 Launch and capture direction Figure 6 – Measurement setup with collinear launch and capture direction |
23 | Figure 7 – Measurement setup with orthogonal launch and capture direction Figure 8 – Measurement setup with oblique launch and capture direction |
24 | 5 Measurement identification code 5.1 General 5.2 Measurement identification code construction 5.2.1 General 5.2.2 AAA – Source characteristics 5.2.3 BBB(b1) – Launch conditions Figure 9 – Measurement identification code construction |
25 | 5.2.4 CCC – Input coupling conditions 5.2.5 DDD – Output coupling conditions 5.2.6 EEE – Capturing conditions 5.3 Extended measurement identification code with customisation parameters 5.3.1 General 5.3.2 Customisation parameters with placeholders |
26 | 5.4 Reference measurements 5.5 Coordinate table AAA – Source characteristics 5.5.1 Mandatory parameters 5.5.2 Customisation parameters Figure 10 – Reference measurements with the same MIC |
27 | Table 2 – AAA coordinate reference for source characteristics |
29 | 5.6 Coordinate table BBB – Launch conditions 5.6.1 Mandatory parameter 5.6.2 Customisation parameters |
30 | Table 3 – BBB coordinate reference for launch conditions |
32 | 5.7 Coordinate table CCC – Input coupling conditions 5.7.1 Mandatory parameters 5.7.2 Customisation parameters |
33 | Table 4 – CCC coordinate reference for input coupling conditions |
34 | 5.8 Coordinate table DDD – Output coupling conditions 5.8.1 Mandatory parameters 5.8.2 Customisation parameters |
35 | Table 5 – DDD coordinate reference for output coupling conditions |
36 | 5.9 Coordinate table EEE – Capturing conditions 5.9.1 Mandatory parameters 5.9.2 Customisation parameters |
37 | Table 6 – EEE coordinate reference for capturing conditions |
39 | 5.10 Examples of deployment 5.10.1 General 5.10.2 MIC-042-113(400)-001-001-112 (integrating sphere device details including supplier and model number) 5.10.3 MIC-072-123(205)-053(1.56, X,X)-001-042 (integrating sphere device details including supplier and model number) |
40 | 5.10.4 Fast polarisation axis: MIC-091-072(150)-042(1.53, 25, -30)-051-004; slow polarisation axis: MIC-091-072(75)-042(1.53, 25, -120)-051-004 |
41 | Annex A (informative)State of the art in optical interconnect technologies A.1 Diversity of optical interconnect technologies A.2 Fibre-optic circuit laminates A.3 Polymer waveguides A.4 Planar glass waveguides |
42 | A.5 Free space optics A.6 Target applications |
43 | Bibliography |