UNE-EN 60749-27:2006/A1:2012:2013 Edition
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Semiconductor devices – Mechanical and climatic test methods – Part 27: Electrostatic discharge (ESD) sensitivity testing – Machine model (MM)
| Published By | Publication Date | Number of Pages |
| AENOR | 2013-01-01 | 11 |
| Published Code | AENOR |
|---|---|
| Published By | Asociación Española de Normalización |
| Publication Date | 2013-01-01 |
| Pages Count | 11 |
| Language | English |
| File Size | 399.4 KB |
| ICS Codes | 31.080.01 - Semiconductor devices in general |
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