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UNE-EN 62047-11:2013

$22.10

Semiconductor devices – Micro-electromechanical devices – Part 11: Test method for coefficients of linear thermal expansion of free-standing materials for micro-electromechanical systems

Published By Publication Date Number of Pages
AENOR 2013-11-01 23
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Published Code

AENOR

Published By

Asociación Española de Normalización

Publication Date

2013-11-01

Pages Count

23

Language

English

File Size

1003.5 KB

ICS Codes 31.080.99 - Other semiconductor devices
UNE-EN 62047-11:2013
$22.10