ASTM-E427 2000

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E427-95(2000) Standard Practice for Testing for Leaks Using the Halogen Leak Detector (Alkali-Ion Diode)

Published By	Publication Date	Number of Pages
ASTM	2000	7

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Categories: 31.080.01 - Semiconductor devices in general, ASTM

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Description

ASTM E427-95-Reapproved2000

Historical Standard: Standard Practice for Testing for Leaks Using the Halogen Leak Detector (Alkali-Ion Diode)

ASTM E427

Scope

1.1 This practice covers procedures for testing and locating the sources of gas leaking at the rate of 2.2 X 10 ^-14 mol/s (5 X 10 ^-10 Std cm³/s). The test may be conducted on any device or component across which a pressure differential of halogen tracer gas may be created, and on which the effluent side of the area to be leak tested is accessible for probing with the halogen leak detector.

1.2 Five methods are described:

1.2.1 Method A -Direct probing with no significant halogen contamination in the atmosphere.

1.2.2 Method B -Direct probing with significant halogen contamination in the atmosphere.

1.2.3 Method C -Shroud test.

1.2.4 Method D -Air-curtain shroud test.

1.2.5 Method E -Accumulation test.

1.3 The values stated in inch-pound units are to be regarded as the standard. The metric equivalents of inch-pound units may be approximate.

1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Keywords

Freon leak testing; Halogen leak testing; Heated anode halogen detection; Leak testing; Leak testing-gas; leak testing-using halogen leak detector, practice

ICS Code

ICS Number Code 31.080.01 (Semi-conductor devices in general)

DOI: 10.1520/E0427-95R00

Additional information

Standard Title	E427-95(2000) Standard Practice for Testing for Leaks Using the Halogen Leak Detector (Alkali-Ion Diode)
Published Code	ASTM
Publication Date	2000
Pages Count	7
ICS Codes	31.080.01 - Semiconductor devices in general