ASTM-F80 1994
$40.63
F80-94 Test Method for Crystallographic Perfection of Epitaxial Deposits of Silicon by Etching Techniques (Withdrawn 1998)
| Published By | Publication Date | Number of Pages |
| ASTM | 1994 | 9 |
ASTM F80-94
Withdrawn Standard: Test Method for Crystallographic Perfection of Epitaxial Deposits of Silicon by Etching Techniques (Withdrawn 1998)
ASTM F80
Scope
Keywords
ICS Code
ICS Number Code 29.045 (Semiconducting materials)
DOI:
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