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BS EN 55016-2-1:2014

BS EN 55016-2-1:2014

$227.44

Specification for radio disturbance and immunity measuring apparatus and methods – Methods of measurement of disturbances and immunity. Conducted disturbance measurements

Published By Publication Date Number of Pages
BSI 2014 112
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CISPR 16-2-1:2014 is designated a basic standard, which specifies the methods of measurement of disturbance phenomena in general in the frequency range 9 kHz to 18 GHz and especially of conducted disturbance phenomena in the frequency range 9 kHz to 30 MHz. With a CDNE, the frequency range is 9 kHz to 300 Hz. This third edition cancels and replaces the second edition published in 2008, Amendment 1:2010 and Amendment 2:2013. This edition constitutes a technical revision which includes added methods of measurement using a new type of ancillary equipment: the CDNE. Key Words: electromagnetic compatibility, EMC, emissions, immunity

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PDF Pages PDF Title
6 English
CONTENTS
12 1 Scope
2 Normative references
13 3 Terms, definitions and abbreviations
3.1 Terms and definitions
18 3.2 Abbreviations
19 4 Types of disturbance to be measured
4.1 General
4.2 Types of disturbance
4.3 Detector functions
20 5 Connection of measuring equipment
5.1 General
5.2 Connection of ancillary equipment
5.3 Connections to RF reference ground
21 5.4 Connection between the EUT and the artificial mains network
Figures
Figure 1 – Example of a recommended test set-up with PE chokes with three AMNs and a sheath current absorber on the RF cable
22 6 General measurement requirements and conditions
6.1 General
6.2 Disturbance not produced by the equipment under test
6.2.1 General
6.2.2 Compliance testing
6.3 Measurement of continuous disturbance
6.3.1 Narrowband continuous disturbance
6.3.2 Broadband continuous disturbance
23 6.3.3 Use of spectrum analyzers and scanning receivers
6.4 EUT arrangement and measurement conditions
6.4.1 EUT arrangement
25 6.4.2 Normal load conditions
6.4.3 Duration of operation
6.4.4 Running-in/warm-up time
26 6.4.5 Supply
6.4.6 Mode of operation
6.4.7 Operation of multifunction equipment
6.4.8 Determination of EUT arrangement(s) that maximize(s) emissions
6.4.9 Recording of measurement results
6.5 Interpretation of measuring results
6.5.1 Continuous disturbance
27 6.5.2 Discontinuous disturbance
6.5.3 Measurement of the duration of disturbances
6.6 Measurement times and scan rates for continuous disturbance
6.6.1 General
6.6.2 Minimum measurement times
28 6.6.3 Scan rates for scanning receivers and spectrum analyzers
Tables
Table 1 – Minimum scan times for the three CISPR bands with peak and quasi-peak detectors
Table 2 – Minimum measurement times for the four CISPR bands
29 6.6.4 Scan times for stepping receivers
30 6.6.5 Strategies for obtaining a spectrum overview using the peak detector
Figure 2 – Measurement of a combination of a CW signal (“NB”) and an impulsive signal (“BB”) using multiple sweeps with maximum hold
31 Figure 3 – Example of a timing analysis
32 Figure 4 – A broadband spectrum measured with a stepped receiver
Figure 5 – Intermittent narrowband disturbances measured using fast short repetitive sweeps with maximum hold function to obtain an overview of the disturbance spectrum
33 6.6.6 Timing considerations using FFT-based instruments
34 Figure 6 – FFT scan in segments
Figure 7 – Frequency resolution enhanced by FFT-based measuring instrument
35 7 Measurement of disturbances conducted along leads, 9 kHz to 30 MHz
7.1 General
7.2 Measuring equipment (receivers, etc.)
7.2.1 General
7.2.2 Use of detectors for conducted disturbance measurements
36 7.3 Ancillary measuring equipment
7.3.1 General
7.3.2 Artificial networks (ANs)
7.3.3 Voltage probes
37 7.3.4 Current probes
7.4 Equipment under test configuration
7.4.1 Arrangement of the EUT and its connection to the AN
Figure 8 – Illustration of current ICCM
39 Figure 9 – Test configuration: table-top equipment for conducted disturbance measurements on power mains
40 Figure 10 – Arrangement of EUT and AMN at 40 cm distance, with a) vertical RGP and b) horizontal RGP
Figure 11 – Optional example test configuration for an EUT with only a power cord attached
41 Figure 12 – Test configuration: floor-standing equipment (see 7.4.1 and 7.5.2.3)
42 7.4.2 Procedure for the measurement of unsymmetric disturbance voltages with V-networks (AMNs)
Figure 13 – Example test configuration: floor-standing and table-top equipment(see 7.4.1 and 7.5.2.3)
44 Figure 14 – Schematic of disturbance voltage measurement configuration (see also 7.5.2.3)
45 Figure 15 – Equivalent circuit for measurement of unsymmetric disturbance voltage for safety-class I (grounded) EUT
46 Figure 16 – Equivalent circuit for measurement of unsymmetric disturbancevoltage for safety-class II (ungrounded) EUT
48 Figure 17 – RC element for artificial hand
Figure 18 – Portable electric drillwith artificial hand
Figure 19 – Portable electric saw with artificial hand
49 7.4.3 Measurement of common mode voltages at differential mode signal terminals
50 7.4.4 Measurements using voltage probes
51 Figure 20 – Measuring example for voltage probes
52 Figure 21 – Measurement arrangement for two-terminal regulating controls
53 7.4.5 Measurement using a capacitive voltage probe (CVP)
7.4.6 Measurements using current probes
7.5 System test configuration for conducted emissions measurements
7.5.1 General approach to system measurements
54 7.5.2 System configuration
56 7.5.3 Measurements of interconnecting lines
57 7.5.4 Decoupling of system components
7.6 In situ measurements
7.6.1 General
7.6.2 Reference ground
58 7.6.3 Measurement with voltage probes
7.6.4 Selection of measuring points
8 Automated measurement of disturbances
8.1 Precautions for automating measurements
59 8.2 Generic measurement procedure
8.3 Prescan measurements
Figure 22 – Generic process to help reduce measurement time
60 8.4 Data reduction
8.5 Disturbance maximization and final measurement
61 8.6 Post processing and reporting
8.7 Disturbance measurement strategies with FFT-based measuring instruments
9 Test set-up and measurement procedure using the CDNE in the frequency range 30 MHz to 300 MHz
9.1 General
62 9.2 Test set-up
63 Figure 23 – Test set-up for measurement of an EUT with one cable
Figure 24 – Test set-up for measurement of an EUT with two cables connected adjacent surfaces of the EUT
64 9.3 Measurement procedure
Figure 25 – Test set-up for measurement of an EUT with two cables connected on the same surface of the EUT
65 Annex A (informative) Guidelines for connection of electrical equipment tothe artificial mains network
A.1 General
A.2 Classification of the possible cases
A.2.1 Well-shielded but poorly filtered EUT (Figures A.1 and A.2)
Figure A.1 – Basic schematic of well-shielded but poorly filtered EUT
66 A.2.2 Well-filtered but incompletely shielded EUT (Figures A.3 and A.4)
A.2.3 Practical general case
Figure A.2 – Detail of well-shielded but poorly filtered EUT
Figure A.3 – Well-filtered but incompletely shielded EUT
Figure A.4 – Well-filtered but incompletely shielded EUT, with U2 reduced to zero
67 Figure A.5 – Disturbance supply through shielded conductors
Figure A.6 – Disturbance supply through unshielded but filtered conductors
68 A.3 Method of grounding
A.4 Conditions of grounding
A.4.1 General
Figure A.7 – Disturbance supply through ordinary conductors
69 A.4.2 Classification of typical testing conditions
70 A.5 Connection of the AMN as a voltage probe
Figure A.8 – AMN configurations
71 Table A.2 – Testing conditions for types of EUTs – Screened cable
72 Annex B (informative) Use of spectrum analyzers and scanning receivers
B.1 General
B.2 Overload
B.3 Linearity test
B.4 Selectivity
B.5 Normal response to pulses
B.6 Peak detection
73 B.7 Frequency scan rate
B.8 Signal interception
B.9 Average detection
B.10 Sensitivity
Table B.1 – Sweep time/frequency or fastest scan rate
74 B.11 Amplitude accuracy
75 Annex C (informative) Decision tree for use of detectors for conducted disturbance measurements
Figure C.1 – Decision tree for optimizing speed of conducted disturbance measurements with peak, quasi-peak and average detectors
77 Annex D (informative) Scan rates and measurement times for use with the average detector
D.1 General
D.2 Suppression of impulsive disturbance
D.2.1 General
78 D.2.2 Suppression of impulsive disturbance by digital averaging
D.3 Suppression of amplitude modulation
D.4 Measurement of slowly intermittent, unsteady or drifting narrowband disturbances
Table D.1 – Pulse suppression factors and scan rates for a 100 Hz video bandwidth
79 Figure D.1 – Weighting function of a 10 ms pulse for peak (“PK”) and average detections with (“CISPR AV”) and without (“AV”) peak reading; meter time constant 160 ms
Figure D.2 – Weighting functions of a 10 ms pulse for peak (“PK”) and average detections with (“CISPR AV”) and without (“AV”) peak reading; meter time constant 100 ms
Table D.2 – Meter time constants and the corresponding video bandwidths and maximum scan rates
80 D.5 Recommended procedure for automated or semi-automated measurements
Figure D.3 – Example of weighting functions (of a 1 Hz pulse) for peak (“PK”) and average detections as a function of pulse width; meter time constant 160 ms
Figure D.4 – Example of weighting functions (of a 1 Hz pulse) for peak (“PK”) and average detections as a function of pulse width; meter time constant 100 ms
81 Annex E (informative) Guidelines for the improvement of the test set-up with ANs
E.1 In situ verification of the AN impedance and voltage division factor
Figure E.1 – Parallel resonance of enclosure capacitance and ground strap inductance
82 Figure E.2 – Connection of an AMN to RGP using a wide grounding sheet for low inductance grounding
Figure E.3 – Impedance measured with the arrangement of Figure E.2 both with reference to the front panel ground and to the grounding sheet
Figure E.4 – VDF in the configuration of Figure E.2 measured with reference to the front panel ground and to the grounding sheet
83 Figure E.5 – Arrangement showing the measurement grounding sheet (shown with dotted lines) when measuring the impedance with reference to RGP
Figure E.6 – Impedance measured with the arrangement of Figure E.5 with reference to the RGP
Figure E.7 – VDF measured with parallel resonances in the AMN grounding
84 E.2 PE chokes and sheath current absorbers for the suppression of ground loops
Figure E.8 – Attenuation of a sheath current absorber measuredin a 150 Ω test arrangement
85 Figure E.9 – Arrangement for the measurement of attenuation dueto PE chokes and sheath current absorbers
86 Annex F (normative)Determination of suitability of spectrum analyzersfor compliance tests
Table F.1 – Maximum amplitude difference between peak and quasi-peak detected signals
87 Annex G (informative) Basic guidance for measurements on telecommunications ports
G.1 Limits
88 G.2 Combination of current probe and capacitive voltage probe (CVP)
G.3 Basic ideas of the capacitive voltage probe
Table G.1 – Summary of advantages and disadvantages of the methods described in the specific subclauses of Annex H
89 G.4 Combination of current limit and voltage limit
90 Figure G.1 – Basic circuit for considering the limits with a defined TCM impedance of 150 Ω
Figure G.2 – Basic circuit for the measurement with unknown TCM impedance
91 G.5 Adjusting the TCM impedance with ferrites
G.6 Ferrite specifications for use with methods of Annex H
92 Figure G.3 – Impedance layout of the components used in Figure H.2
93 Figure G.4 – Basic test set-up to measure combined impedance of the 150 Ω and ferrites
94 Annex H (normative) Specific guidance for conducted disturbance measurements on telecommunication ports
H.1 General
Table H.1 – Telecommunication port disturbance measurement procedure selection
95 H.2 Characteristics of AANs
Table H.2 – aLCL values
96 H.3 Characteristics of current probe
H.4 Characteristics of capacitive voltage probe
H.5 Procedures for common mode measurements
H.5.1 General
H.5.2 Measurement procedure using AANs
97 H.5.3 Measurement procedure using a 150 Ω load connected to the outside surfaceof the cable screen
Figure H.1 – Measurement set-up using an AAN
98 H.5.4 Measurement procedure using a combination of current probe and capacitivevoltage probe
Figure H.2 – Measurement set-up using a 150 Ω loadto the outside surface of the shield
99 H.5.5 Measurement of cable, ferrite and AE common mode impedance
Figure H.3 – Measurement set-up using current and capacitive voltage probes
100 Figure H.4 – Characterization set-up
101 Annex I (informative)Examples of AANs and ANs for screened cables
Figure I.1 – Example AAN for use with unscreened single balanced pairs
102 Figure I.2 – Example AAN with high LCL for use with either one or two unscreened balanced pairs
103 Figure I.3 – Example AAN with high LCL for usewith one, two, three, or four unscreened balanced pairs
104 Figure I.4 – Example AAN, including a 50 Ω source matching network at the voltage measuring port, for use with two unscreened balanced pairs
105 Figure I.5 – Example AAN for use with two unscreened balanced pairs
106 Figure I.6 – Example AAN, including a 50 Ω source matching network at the voltage measuring port, for use with four unscreened balanced pairs
107 Figure I.7 – Example AAN for use with four unscreened balanced pairs
108 Figure I.8 – Example AN for use with coaxial cables, employing an internal common mode choke created by bifilar winding an insulated centre-conductor wireand an insulated screen-conductor wire on a common magnetic core(for example, a ferrite toroid)
Figure I.9 – Example AN for use with coaxial cables, employing an internal common mode choke created by miniature coaxial cable (miniature semi-rigid solid copper screen or miniature double-braided screen coaxial cable) wound on ferrite toroids
109 Figure I.10 – Example AN for use with multi-conductor screened cables, employing an internal common mode choke created by bifilar winding multiple insulated signal wires and an insulated screen-conductor wire on a common magnetic core (for example, a ferrite toroid)
Figure I.11 – Example AN for use with multi-conductor screened cables, employing an internal common mode choke created by winding a multi-conductor screened cable on ferrite toroids

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BS EN 55016-2-1:2014
$227.44