BS ISO 21222:2020
$142.49
Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
| Published By | Publication Date | Number of Pages |
| BSI | 2020 | 26 |
This document describes a procedure for the determination of elastic modulus for compliant materials using atomic force microscope (AFM). Force-distance curves on the surface of compliant materials are measured and the analysis uses a two-point method based on Johnson-Kendall-Roberts (JKR) theory. This document is applicable to compliant materials with elastic moduli ranging from 100 kPa to 1 GPa. The spatial resolution is dependent on the contact radius between the AFM probe and the surface and is typically approximately10-20 nm.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 2 | National foreword |
| 6 | Foreword |
| 7 | Introduction |
| 9 | 1 Scope 2 Normative references 3 Terms and definitions |
| 12 | 4 Symbols (and abbreviated terms) 5 Review of contact mechanics 5.1 Introduction |
| 13 | 5.2 Hertzian model 5.3 Derjaguin-Muller-Toporov (DMT) Model |
| 14 | 5.4 Johnson-Kendall-Roberts (JKR) model 5.5 JKR–DMT transition 6 Procedure of determination of elastic modulus 6.1 Introduction and limitations |
| 15 | 6.2 Measurement of deflection sensitivity and spring constant 6.3 Measurement of tip radius 6.4 Measurement of force-distance curve |
| 16 | 6.5 Force-distance curve conversion 6.6 JKR two-point method |
| 17 | 6.7 Uncertainties 6.8 Reporting results |
| 19 | Annex A (informative) Example measurements |
| 23 | Annex B (informative) Result of Inter-laboratory Comparison |
| 25 | Bibliography |
