BS ISO 21363:2020
$215.11
Nanotechnologies. Measurements of particle size and shape distributions by transmission electron microscopy
| Published By | Publication Date | Number of Pages |
| BSI | 2020 | 92 |
This document specifies how to capture, measure and analyse transmission electron microscopy images to obtain particle size and shape distributions in the nanoscale.
This document broadly is applicable to nano-objects as well as to particles with sizes larger than 100 nm. The exact working range of the method depends on the required uncertainty and on the performance of the transmission electron microscope. These elements can be evaluated according to the requirements described in this document.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 2 | undefined |
| 7 | Foreword |
| 8 | Introduction |
| 9 | 1 Scope 2 Normative references 3 Terms, definitions and symbols 3.1 Core terms — Particles |
| 12 | 3.2 Core terms — Image capture and analysis |
| 13 | 3.3 Core terms — Statistical symbols and definitions |
| 15 | 3.4 Core terms — Measurands |
| 18 | 3.5 Core terms — Metrology |
| 21 | 3.6 Core terms — Transmission electron microscopy |
| 22 | 3.7 Statistical symbols, measurands and descriptors 3.7.1 Statistical symbols 3.7.2 Measurands and descriptors |
| 23 | 4 Stakeholder needs for TEM measurement procedures |
| 24 | 5 Sample preparation 5.1 General |
| 25 | 5.2 Sample sources 5.3 Use a representative sample 5.3.1 General 5.3.2 Powder samples 5.3.3 Nanoparticle dispersions in liquids |
| 26 | 5.4 Minimize particle agglomeration in the sample dispersion 5.5 Selection of the mounting support 6 Instrument factors 6.1 Instrument set-up |
| 27 | 6.2 Calibration 6.2.1 General 6.2.2 Calibration standards 6.2.3 General calibration procedure |
| 29 | 6.3 Setting TEM operating conditions for calibration |
| 30 | 7 Image capture 7.1 General 7.2 Setting a suitable operating magnification |
| 31 | 7.3 Minimum particle area 7.4 Number of particles to count for particle size and shape distributions |
| 32 | 7.5 Uniform background 7.6 Measurement procedure 7.6.1 General |
| 33 | 7.6.2 Developing a test sample 7.6.3 Effects of magnification 7.6.4 Frames (micrographs) 7.7 Revision of image capture protocols 8 Particle analysis 8.1 General 8.2 Individual particle analysis |
| 34 | 8.3 Automated particle analysis 8.4 Example — Automated particle analysis procedure |
| 35 | 9 Data analysis 9.1 General 9.2 Raw data triage — Detecting touching particles, unselected particles, artefacts and contaminants |
| 36 | 9.3 Data quality assessment — Repeatability, intermediate precision and reproducibility |
| 38 | 9.4 Fitting distributions to data |
| 39 | 9.5 Assessing measurement uncertainty for samples under repeatability, intermediate precision or reproducibility conditions 9.5.1 Grand statistics for fitted parameters — Three or more datasets 9.5.2 Measurement uncertainty of fitted parameters |
| 40 | 9.5.3 Example — Measurement uncertainty for a size descriptor 9.6 Bivariate analysis |
| 41 | 10 Reporting |
| 44 | Annex A (informative) Case studies overview |
| 46 | Annex B (informative) Discrete spheroidal nanoparticles |
| 49 | Annex C (informative) Size mixture |
| 61 | Annex D (informative) Shape mixture |
| 66 | Annex E (informative) Amorphous aggregates |
| 70 | Annex F (informative) Nanocrystalline aggregates |
| 74 | Annex G (informative) Nanofibres with irregular cross-sections |
| 81 | Annex H (informative) Nanoparticles with specific crystal habits |
| 88 | Bibliography |
