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BSI PD CEN/ISO TS 17444-2:2017 – TC:2020 Edition

$280.87

Tracked Changes. Electronic fee collection. Charging performance – Examination Framework

Published By Publication Date Number of Pages
BSI 2020 238
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PDF Catalog

PDF Pages PDF Title
134 undefined
136 European foreword
Endorsement notice
140 Foreword
141 Introduction
144 1 Scope
2 Normative references
145 3 Terms and definitions
149 4 Symbols and abbreviated terms
150 5 Examination Framework
5.1 General
151 5.2 Method for defining a Specific Examination Framework
5.2.1 General
152 5.2.2 Selection of metrics to be evaluated
5.2.3 Definition of environmental conditions and associated performance requirements
5.2.4 Determination of Required Sample Sizes
153 5.2.5 Selection of methods for generating Charging Input and Reference Data
5.2.6 Determination of Test Routes/Subset of Charged Network for generating representative trips
5.2.7 Documentation of the Specific Examination Framework
5.3 Sources of data
156 5.4 Methods of generating charging input
5.4.1 General
157 5.4.2 Predefined routes (identifier: “PVP”)
158 5.4.3 Reference System (used in combination with identifiers: “PVR” and “UVR”)
159 5.4.4 Simulated OBE/FE (identifier: “SO”)
160 5.4.5 Dedicated OBE Testing (identifier: “DO”)
5.5 Applicability of metrics scheme types
165 5.6 Charging Metric Selection Tables
5.6.1 General
5.6.2 DSRC Discrete
166 5.6.3 Autonomous Discrete
167 5.6.4 Autonomous Continuous
169 6 Examination Tests
6.1 Common (and DSRC Discrete) Examination Tests
6.1.1 General
6.1.2 ET-CM-E2E-1 E2E — Correct Charging Rate
170 6.1.3 ET-CM-E2E-2 E2E — Overcharging Rate
6.1.4 ET-CM-E2E-3 E2E — Undercharging Rate
171 6.1.5 ET-CM-E2E-4 E2E — Late Charging Rate
172 6.1.6 ET-CM-UA-1 UA — Correct Charging Rate
6.1.7 ET-CM-UA-2 UA — Overcharging Rate
173 6.1.8 ET-CM-UA-3 UA — Undercharging Rate
174 6.1.9 ET-CM-UA-4 UA — Accurate application of Payments and Refunds
6.1.10 ET-CM-UA-5 UA — Accurate Personalisation of OBUs
175 6.1.11 ET-CM-PC-1 PC — Correct Charging Rate
6.1.12 ET-CM-PC-2 PC — Overcharging Rate
176 6.1.13 ET-CM-PC-3 PC — Undercharging Rate
177 6.1.14 ET-CM-PC-4 PC — Latency — TC
6.1.15 ET-CM-PC-5 PC — Late Payment Claims Rate
178 6.1.16 ET-CM-PC-6 PC — Rejected Payment Claim Rate
6.1.17 ET-CM-BD-1 BD — Correct Charging Rate
179 6.1.18 ET-CM-BD-2 BD — Overcharging Rate
180 6.1.19 ET-CM-BD-3 BD — Undercharging Rate
6.1.20 ET-CM-BD-4 BD — Incorrect Charging Rate
181 6.1.21 ET-CM-BD-5 BD — Latency — TC
6.1.22 ET-CM-BD-6 BD — Late Billing Details Rate
182 6.1.23 ET-CM-BD-7 BD — Rejected Billing Details Rate
6.1.24 ET-CM-BD-8 BD — Incorrectly rejected Billing Details Rate
183 6.1.25 ET-CM-BD-9 BD — Inferred Billing Details Rate
6.2 DSRC Discrete — Optional DSRC Toll Declaration Metrics
6.2.1 General
6.2.2 ET-CM-TD-1 TD — Correct Toll Declaration Generation Rate
184 6.2.3 ET-CM-TD-2 TD — Incorrect Toll Declaration Generation Rate
6.2.4 ET-CM-TD-3 TD — Late Toll Declarations Rate
185 6.2.5 ET-CM-TD-4 TD — TSP Charge Parameter Change Rate
6.2.6 ET-CM-TD-5 TD — TSP False Positive Rate
186 6.3 Autonomous Discrete Specific Examination Tests
6.3.1 General
6.3.2 ET-CM-TD-1 TD — Correct Toll Declaration Generation Rate
6.3.3 ET-CM-TD-2 TD — Incorrect Toll Declaration Generation Rate
187 6.3.4 ET-CM-TD-3 TD — Late Toll Declarations Rate
6.3.5 ET-CM-TD-4 TD — TSP Charge Parameter Change Rate
188 6.3.6 ET-CM-TD-5 TD — TSP False Positive Rate
6.3.7 ET-CM-DTD-1 DTD — Correct Charging Rate (charge object detections)
189 6.3.8 ET-CM-DTD-2 DTD — Incorrect Charge Event Recognition Rate
6.3.9 ET-CM-DTD-3 DTD — Missed Charge Object Detection Rate
190 6.3.10 ET-CM-DTD-4 DTD Overcharging Rate
6.3.11 ET-CM-CR-1 CR — Correct Charge Report Generation Rate
191 6.3.12 ET-CM-CR-2 CR — Incorrect Charge Report Generation Rate
6.3.13 ET-CM-CR-3 CR — Charge Report Latency
192 6.3.14 ET-CM-CR-4 CR — TSP Front End Charge Parameter Change Rate
6.3.15 ET-CM-CR-5 CR — TSP Front End False Positive Rate
193 6.3.16 ET-CM-DCR-1 DCR — Correct Charging Rate (charge object detections)
6.3.17 ET-CM-DCR-2 DCR — Incorrect Charge Event Recognition Rate
194 6.3.18 ET-CM-DCR-3 DCR — Missed Charge Object Detection Rate
6.3.19 ET-CM-DCR-4 DCR — Overcharging rate (Incorrect false positive Charge Event Recognition)
195 6.4 Autonomous Continuous Specific Examination Tests
6.4.1 General
6.4.2 ET-CM-TD-1 TD — Correct Toll Declaration Generation Rate
6.4.3 ET-CM-TD-2 TD — Incorrect Toll Declaration Generation Rate
196 6.4.4 ET-CM-TD-3 TD — Late Toll Declarations Rate
6.4.5 ET-CM-TD-4 TD — TSP Charge Parameter Change Rate
197 6.4.6 ET-CM-TD-5 TD — TSP False Positive Rate
6.4.7 ET-CM-CTD-1 CTD Correct Charging Rate
198 6.4.8 ET-CM-CTD-2 CTD Overcharging Rate
6.4.9 ET-CM-CTD-3 CTD Accuracy of Distance/Time Measurement
199 6.4.10 ET-CM-CR-1 CR — Correct Charge Report Generation Rate
6.4.11 ET-CM-CR-2 CR — Incorrect Charge Report Generation Rate
200 6.4.12 ET-CM-CR-3 CR — Charge Report Latency
6.4.13 ET-CM-CR-4 CR — TSP Front End Charge Parameter Change Rate
201 6.4.14 ET-CM-CR-5 CR — TSP Front End False Positive Rate
6.4.15 ET-CM-CCR-1 CCR — Correct Charging Rate
202 6.4.16 ET-CM-CCR-2 CCR — Overcharging Rate
6.4.17 ET-CM-CCR-3 CCR — Accuracy of Distance/Time Measurement
204 Annex A (informative) Examination Test documentation template
205 Annex B (informative) Examination Framework considerations
209 Annex C (informative) Statistical considerations
215 Annex D (informative) Methods for reducing sample sizes for very high/low probability metrics during the Evaluation Phase
219 Annex E (informative) Example-specific Examination Frameworks
236 Bibliography
BSI PD CEN/ISO TS 17444-2:2017 - TC
$280.87