BSI PD CEN/ISO TS 17444-2:2017 – TC:2020 Edition
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Tracked Changes. Electronic fee collection. Charging performance – Examination Framework
Published By | Publication Date | Number of Pages |
BSI | 2020 | 238 |
PDF Catalog
PDF Pages | PDF Title |
---|---|
134 | undefined |
136 | European foreword Endorsement notice |
140 | Foreword |
141 | Introduction |
144 | 1 Scope 2 Normative references |
145 | 3 Terms and definitions |
149 | 4 Symbols and abbreviated terms |
150 | 5 Examination Framework 5.1 General |
151 | 5.2 Method for defining a Specific Examination Framework 5.2.1 General |
152 | 5.2.2 Selection of metrics to be evaluated 5.2.3 Definition of environmental conditions and associated performance requirements 5.2.4 Determination of Required Sample Sizes |
153 | 5.2.5 Selection of methods for generating Charging Input and Reference Data 5.2.6 Determination of Test Routes/Subset of Charged Network for generating representative trips 5.2.7 Documentation of the Specific Examination Framework 5.3 Sources of data |
156 | 5.4 Methods of generating charging input 5.4.1 General |
157 | 5.4.2 Predefined routes (identifier: “PVP”) |
158 | 5.4.3 Reference System (used in combination with identifiers: “PVR” and “UVR”) |
159 | 5.4.4 Simulated OBE/FE (identifier: “SO”) |
160 | 5.4.5 Dedicated OBE Testing (identifier: “DO”) 5.5 Applicability of metrics scheme types |
165 | 5.6 Charging Metric Selection Tables 5.6.1 General 5.6.2 DSRC Discrete |
166 | 5.6.3 Autonomous Discrete |
167 | 5.6.4 Autonomous Continuous |
169 | 6 Examination Tests 6.1 Common (and DSRC Discrete) Examination Tests 6.1.1 General 6.1.2 ET-CM-E2E-1 E2E — Correct Charging Rate |
170 | 6.1.3 ET-CM-E2E-2 E2E — Overcharging Rate 6.1.4 ET-CM-E2E-3 E2E — Undercharging Rate |
171 | 6.1.5 ET-CM-E2E-4 E2E — Late Charging Rate |
172 | 6.1.6 ET-CM-UA-1 UA — Correct Charging Rate 6.1.7 ET-CM-UA-2 UA — Overcharging Rate |
173 | 6.1.8 ET-CM-UA-3 UA — Undercharging Rate |
174 | 6.1.9 ET-CM-UA-4 UA — Accurate application of Payments and Refunds 6.1.10 ET-CM-UA-5 UA — Accurate Personalisation of OBUs |
175 | 6.1.11 ET-CM-PC-1 PC — Correct Charging Rate 6.1.12 ET-CM-PC-2 PC — Overcharging Rate |
176 | 6.1.13 ET-CM-PC-3 PC — Undercharging Rate |
177 | 6.1.14 ET-CM-PC-4 PC — Latency — TC 6.1.15 ET-CM-PC-5 PC — Late Payment Claims Rate |
178 | 6.1.16 ET-CM-PC-6 PC — Rejected Payment Claim Rate 6.1.17 ET-CM-BD-1 BD — Correct Charging Rate |
179 | 6.1.18 ET-CM-BD-2 BD — Overcharging Rate |
180 | 6.1.19 ET-CM-BD-3 BD — Undercharging Rate 6.1.20 ET-CM-BD-4 BD — Incorrect Charging Rate |
181 | 6.1.21 ET-CM-BD-5 BD — Latency — TC 6.1.22 ET-CM-BD-6 BD — Late Billing Details Rate |
182 | 6.1.23 ET-CM-BD-7 BD — Rejected Billing Details Rate 6.1.24 ET-CM-BD-8 BD — Incorrectly rejected Billing Details Rate |
183 | 6.1.25 ET-CM-BD-9 BD — Inferred Billing Details Rate 6.2 DSRC Discrete — Optional DSRC Toll Declaration Metrics 6.2.1 General 6.2.2 ET-CM-TD-1 TD — Correct Toll Declaration Generation Rate |
184 | 6.2.3 ET-CM-TD-2 TD — Incorrect Toll Declaration Generation Rate 6.2.4 ET-CM-TD-3 TD — Late Toll Declarations Rate |
185 | 6.2.5 ET-CM-TD-4 TD — TSP Charge Parameter Change Rate 6.2.6 ET-CM-TD-5 TD — TSP False Positive Rate |
186 | 6.3 Autonomous Discrete Specific Examination Tests 6.3.1 General 6.3.2 ET-CM-TD-1 TD — Correct Toll Declaration Generation Rate 6.3.3 ET-CM-TD-2 TD — Incorrect Toll Declaration Generation Rate |
187 | 6.3.4 ET-CM-TD-3 TD — Late Toll Declarations Rate 6.3.5 ET-CM-TD-4 TD — TSP Charge Parameter Change Rate |
188 | 6.3.6 ET-CM-TD-5 TD — TSP False Positive Rate 6.3.7 ET-CM-DTD-1 DTD — Correct Charging Rate (charge object detections) |
189 | 6.3.8 ET-CM-DTD-2 DTD — Incorrect Charge Event Recognition Rate 6.3.9 ET-CM-DTD-3 DTD — Missed Charge Object Detection Rate |
190 | 6.3.10 ET-CM-DTD-4 DTD Overcharging Rate 6.3.11 ET-CM-CR-1 CR — Correct Charge Report Generation Rate |
191 | 6.3.12 ET-CM-CR-2 CR — Incorrect Charge Report Generation Rate 6.3.13 ET-CM-CR-3 CR — Charge Report Latency |
192 | 6.3.14 ET-CM-CR-4 CR — TSP Front End Charge Parameter Change Rate 6.3.15 ET-CM-CR-5 CR — TSP Front End False Positive Rate |
193 | 6.3.16 ET-CM-DCR-1 DCR — Correct Charging Rate (charge object detections) 6.3.17 ET-CM-DCR-2 DCR — Incorrect Charge Event Recognition Rate |
194 | 6.3.18 ET-CM-DCR-3 DCR — Missed Charge Object Detection Rate 6.3.19 ET-CM-DCR-4 DCR — Overcharging rate (Incorrect false positive Charge Event Recognition) |
195 | 6.4 Autonomous Continuous Specific Examination Tests 6.4.1 General 6.4.2 ET-CM-TD-1 TD — Correct Toll Declaration Generation Rate 6.4.3 ET-CM-TD-2 TD — Incorrect Toll Declaration Generation Rate |
196 | 6.4.4 ET-CM-TD-3 TD — Late Toll Declarations Rate 6.4.5 ET-CM-TD-4 TD — TSP Charge Parameter Change Rate |
197 | 6.4.6 ET-CM-TD-5 TD — TSP False Positive Rate 6.4.7 ET-CM-CTD-1 CTD Correct Charging Rate |
198 | 6.4.8 ET-CM-CTD-2 CTD Overcharging Rate 6.4.9 ET-CM-CTD-3 CTD Accuracy of Distance/Time Measurement |
199 | 6.4.10 ET-CM-CR-1 CR — Correct Charge Report Generation Rate 6.4.11 ET-CM-CR-2 CR — Incorrect Charge Report Generation Rate |
200 | 6.4.12 ET-CM-CR-3 CR — Charge Report Latency 6.4.13 ET-CM-CR-4 CR — TSP Front End Charge Parameter Change Rate |
201 | 6.4.14 ET-CM-CR-5 CR — TSP Front End False Positive Rate 6.4.15 ET-CM-CCR-1 CCR — Correct Charging Rate |
202 | 6.4.16 ET-CM-CCR-2 CCR — Overcharging Rate 6.4.17 ET-CM-CCR-3 CCR — Accuracy of Distance/Time Measurement |
204 | Annex A (informative) Examination Test documentation template |
205 | Annex B (informative) Examination Framework considerations |
209 | Annex C (informative) Statistical considerations |
215 | Annex D (informative) Methods for reducing sample sizes for very high/low probability metrics during the Evaluation Phase |
219 | Annex E (informative) Example-specific Examination Frameworks |
236 | Bibliography |