VDI/VDE 5575 Part 2:2019 Edition
$31.85
X-ray optical systems – Measurement methods; Measurement set-up and methods for the evaluation of X-ray optical systems
| Published By | Publication Date | Number of Pages |
| DIN | 2019-12 | 31 |
The standard describes the measurement set-up and methods to evaluate X-ray optical systems. Methods to characterise geometric properties of X-rays are described as well as approaches for their spectral analysis. Coordinate systems for non-ambiguous description of the measurement set-up are defined. Positioning and detector systems suitable for the different measurement tasks are specified. An overview of common X-ray sources is given. The typical properties of the different X-ray sources relevant for their measurement are described.
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