ISO 10810:2010
$41.60
Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
| Published By | Publication Date | Number of Pages |
| ISO | 2010-11 | 34 |
ISO 10810:2010 is intended to aid the operators of X-ray photoelectron spectrometers in their analysis of typical samples. It takes the operator through the analysis from the handling of the sample and the calibration and setting-up of the spectrometer to the acquisition of wide and narrow scans and also gives advice on quantification and on preparation of the final report.
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