{"id":291281,"date":"2024-10-19T19:46:39","date_gmt":"2024-10-19T19:46:39","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iso-212222020\/"},"modified":"2024-10-25T16:48:18","modified_gmt":"2024-10-25T16:48:18","slug":"bs-iso-212222020","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iso-212222020\/","title":{"rendered":"BS ISO 21222:2020"},"content":{"rendered":"
This document describes a procedure for the determination of elastic modulus for compliant materials using atomic force microscope (AFM). Force-distance curves on the surface of compliant materials are measured and the analysis uses a two-point method based on Johnson-Kendall-Roberts (JKR) theory. This document is applicable to compliant materials with elastic moduli ranging from 100 kPa to 1 GPa. The spatial resolution is dependent on the contact radius between the AFM probe and the surface and is typically approximately10-20 nm.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
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2<\/td>\n | National foreword <\/td>\n<\/tr>\n | ||||||
6<\/td>\n | Foreword <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | Introduction <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | 4 Symbols (and abbreviated terms) 5 Review of contact mechanics 5.1 Introduction <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | 5.2 Hertzian model 5.3 Derjaguin-Muller-Toporov (DMT) Model <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 5.4 Johnson-Kendall-Roberts (JKR) model 5.5 JKR\u2013DMT transition 6 Procedure of determination of elastic modulus 6.1 Introduction and limitations <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | 6.2 Measurement of deflection sensitivity and spring constant 6.3 Measurement of tip radius 6.4 Measurement of force-distance curve <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | 6.5 Force-distance curve conversion 6.6 JKR two-point method <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | 6.7 Uncertainties 6.8 Reporting results <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | Annex A (informative) Example measurements <\/td>\n<\/tr>\n | ||||||
23<\/td>\n | Annex B (informative) Result of Inter-laboratory Comparison <\/td>\n<\/tr>\n | ||||||
25<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method<\/b><\/p>\n |