{"id":397154,"date":"2024-10-20T04:28:38","date_gmt":"2024-10-20T04:28:38","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-592-2007\/"},"modified":"2024-10-26T08:16:03","modified_gmt":"2024-10-26T08:16:03","slug":"ieee-592-2007","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-592-2007\/","title":{"rendered":"IEEE 592-2007"},"content":{"rendered":"
Revision Standard – Superseded. Revision of IEEE Std 592-1990. Design test for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV is provided in this standard.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
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1<\/td>\n | IEEE Std 592-2007 Front cover <\/td>\n<\/tr>\n | ||||||
3<\/td>\n | Title Page <\/td>\n<\/tr>\n | ||||||
6<\/td>\n | Introduction Notice to users Laws and regulations Copyrights <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | Updating of IEEE documents Errata Interpretations Patents <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | Participants <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | Contents <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | IMPORTANT NOTICE 1. Scope 2. Normative references <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | 3. Performance requirements 4. Test procedures <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Connectors<\/b><\/p>\n |