{"id":399931,"date":"2024-10-20T04:46:18","date_gmt":"2024-10-20T04:46:18","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-98-2002-2\/"},"modified":"2024-10-26T08:34:16","modified_gmt":"2024-10-26T08:34:16","slug":"ieee-98-2002-2","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-98-2002-2\/","title":{"rendered":"IEEE 98-2002"},"content":{"rendered":"
Revision Standard – Superseded. Reaffirmed September 2007. Principles for the development of test procedures to evaluate the thermal endurance of solid electrical insulating materials in air are given in this standard.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
---|---|---|---|---|---|---|---|
2<\/td>\n | Title Page <\/td>\n<\/tr>\n | ||||||
4<\/td>\n | Introduction Participants <\/td>\n<\/tr>\n | ||||||
6<\/td>\n | CONTENTS <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | 1. Overview 1.1 Scope <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | 2. References 3. Definitions <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | 4. General considerations 4.1 Results of thermal endurance tests 4.2 End-point criteria 4.3 Test procedures and conditions 4.4 Variability <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | 5. Use of thermal evaluation data 6. Experimental procedure guidelines 6.1 Selection of test methods <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | 6.2 Selection of end-points 6.3 Preparation of test specimens 6.4 Number of test specimens <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | 6.5 Establishment of initial property value 6.6 Temperature exposures and times 6.7 Aging ovens <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 6.8 Procedure for aging <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | 7. Evaluation 7.1 Numerical analysis of thermal aging data 7.2 Times\/temperatures to end-point criterion <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | 7.3 Extrapolation of the data <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | 7.4 Determination of temperature index (TI) <\/td>\n<\/tr>\n | ||||||
18<\/td>\n | 7.5 Test report <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | Annex A \n(normative) \nFix d time frame method (FTFM)of sampling <\/td>\n<\/tr>\n | ||||||
21<\/td>\n | Annex B \n(normative) \nFix d temperature method of sampling <\/td>\n<\/tr>\n | ||||||
23<\/td>\n | Annex C \n(informative) \nBibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" IEEE Standard for the Preparation of Test Procedures for the Thermal Evaluation of Solid Electrical Insulating Materials<\/b><\/p>\n |