{"id":423714,"date":"2024-10-20T06:48:05","date_gmt":"2024-10-20T06:48:05","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iso-146062022\/"},"modified":"2024-10-26T12:45:59","modified_gmt":"2024-10-26T12:45:59","slug":"bs-iso-146062022","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iso-146062022\/","title":{"rendered":"BS ISO 14606:2022"},"content":{"rendered":"

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
2<\/td>\nNational foreword <\/td>\n<\/tr>\n
6<\/td>\nForeword <\/td>\n<\/tr>\n
7<\/td>\nIntroduction <\/td>\n<\/tr>\n
9<\/td>\n1 Scope
2 Normative references
3 Terms and definitions
4 Symbols and abbreviated terms <\/td>\n<\/tr>\n
10<\/td>\n5 Setting parameters for sputter depth profiling
5.1 General
5.2 Auger electron spectroscopy <\/td>\n<\/tr>\n
11<\/td>\n5.3 X-ray photoelectron spectroscopy
5.4 Secondary ion mass spectrometry <\/td>\n<\/tr>\n
12<\/td>\n6 Depth resolution at an ideally sharp interface in sputter depth profiles
6.1 Measurement of depth resolution
6.2 Average sputtering rate \ufffc
6.3 Depth resolution \u2206z <\/td>\n<\/tr>\n
13<\/td>\n7 Procedures for optimization of parameter settings
7.1 Alignment of sputtered area with a smaller analysis area
7.1.1 General <\/td>\n<\/tr>\n
14<\/td>\n7.1.2 AES <\/td>\n<\/tr>\n
15<\/td>\n7.1.3 XPS with a small probe (e.g. monochromator)
7.1.4 XPS with a large area source (e.g. without monochromator)
7.1.5 SIMS
7.2 Optimization of parameter settings <\/td>\n<\/tr>\n
17<\/td>\nAnnex A (informative) Factors influencing the depth resolution <\/td>\n<\/tr>\n
20<\/td>\nAnnex B (informative) Typical single-layered systems as reference materials <\/td>\n<\/tr>\n
21<\/td>\nAnnex C (informative) Typical multilayered systems used as reference materials <\/td>\n<\/tr>\n
22<\/td>\nAnnex D (informative) Uses of multilayered systems <\/td>\n<\/tr>\n
23<\/td>\nBibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2023<\/td>\n26<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":423724,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[1000,2641],"product_tag":[],"class_list":{"0":"post-423714","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-71-040-40","7":"product_cat-bsi","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/423714","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/423724"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=423714"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=423714"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=423714"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}