{"id":565150,"date":"2024-11-05T18:51:54","date_gmt":"2024-11-05T18:51:54","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/iec-60444-82016\/"},"modified":"2024-11-05T18:51:54","modified_gmt":"2024-11-05T18:51:54","slug":"iec-60444-82016","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/iec\/iec-60444-82016\/","title":{"rendered":"IEC 60444-8:2016"},"content":{"rendered":"<p>IEC\u00a060444-8:2016 describes test fixtures suitable for leadless surface mounted quartz crystal units in enclosures as defined in IEC\u00a061837 (all parts). These fixtures allow the measurement of (series) resonance frequency, (series) resonance resistance, and equivalent electrical circuit parameters L1, C1 and C0 using the measurement techniques specified in IEC\u00a060444-5 and for the determination of\u00a0 load resonance frequency and load resonance resistance according to IEC\u00a0TR\u00a060444-4 and IEC\u00a060444-11.<br \/>\nTwo test fixtures are described in this document:<br \/>\n1)\u00a0\u00a0 A fixture using the p-network circuit with electrical values as described in IEC\u00a060444-1 for measurements in transmission mode up to 500 MHz. This fixture includes optional means to add physical load capacitors for the measurement of load resonance parameters up to 30 MHz in accordance with IEC\u00a060444-4. The range of load capacitance is 10\u00a0pF or more. Calibration of the measurement system and CL adapter board is explained hereinafter.<br \/>\n2)\u00a0\u00a0 A fixture based on the reflection method, suitable for a frequency range up to 1 200 MHz. No provisions for adding a physical load capacitance are anticipated. Load resonance parameters can be measured by using the method of IEC\u00a060444-11.<br \/>\nThis edition includes the following significant technical changes with respect to the previous edition:<br \/>\na)\u00a0\u00a0 modification of Clause 1;<br \/>\nb)\u00a0\u00a0 modification of 5.2;<br \/>\nc)\u00a0\u00a0 modification of 5.3;<br \/>\nd)\u00a0\u00a0 modification of 5.4;<br \/>\ne)\u00a0\u00a0 6.3 Calibration of the reflection measurement system.<\/p>\n","protected":false},"excerpt":{"rendered":"<p><b>Measurement of quartz crystal unit parameters &#8211; Part 8 : Test fixture for surface mounted quartz crystal units<\/b><\/p>\n<table style=\"width: 100%\" border=\"0\" cellspacing=\"0\" cellpadding=\"0\">\n<tbody>\n<tr>\n<td>Published By<\/td>\n<td>Publication Date<\/td>\n<td>Number of Pages<\/td>\n<\/tr>\n<tr>\n<td><a href=\"https:\/\/pdfstandards.shop\/product-category\/publishers\/iec\/\"><b>IEC<\/b><\/a><\/td>\n<td>2016-12-15<\/td>\n<td>34<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":565163,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[580,2636],"product_tag":[],"class_list":{"0":"post-565150","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-31-140","7":"product_cat-iec","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/565150","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/565163"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=565150"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=565150"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=565150"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}