{"id":81721,"date":"2024-10-17T18:57:38","date_gmt":"2024-10-17T18:57:38","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-iec-62527-2007\/"},"modified":"2024-10-24T19:47:43","modified_gmt":"2024-10-24T19:47:43","slug":"ieee-iec-62527-2007","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-iec-62527-2007\/","title":{"rendered":"IEEE IEC 62527 2007"},"content":{"rendered":"
New IEEE Standard – Active. This standard extends IEEE Std 1450-1999 (STIL) to support the definition of DC levels. STIL language constructs are defined to specify the DC conditions necessary to execute digital vectors on automated test equipment (ATE). STIL language extensions include structures for: (a) specifying the DC conditions for a device under test; (b) specifying DC conditions either globally, by pattern burst, by pattern, or by vector; (c) specifying alternate DC levels; and (d) selecting DC levels and alternate levels within a period, much the same as timed format events.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
---|---|---|---|---|---|---|---|
4<\/td>\n | CONTENTS <\/td>\n<\/tr>\n | ||||||
6<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | Title page <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | IEEE Introduction <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | 1. Overview <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | 1.1 Scope <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | 1.2 Purpose 2. References 3. Definitions, acronyms, and abbreviations 3.1 Definitions <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | 3.2 Acronyms and abbreviations <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | 4. Structure of this standard 5. Extensions to Clause 6, STIL syntax description 5.1 Additional reserved words 5.2 DC expressions and units (dc_expr) <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | 5.3 Additions to STIL name spaces and name resolution (IEEE Std 1450-1999, 6.16) 6. Statement structure and organization of STIL information 6.1 Top-level statements and required ordering <\/td>\n<\/tr>\n | ||||||
18<\/td>\n | 6.2 Optional top-level statements 7. Extensions to Clause 8, STIL statement <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | 7.1 STIL syntax 7.2 STIL example 8. Extensions to Clause 19, Spec and Selector blocks 9. Extensions to Clause 16, PatternExec block 9.1 PatternExec block syntax <\/td>\n<\/tr>\n | ||||||
20<\/td>\n | 9.2 PatternExec block example 9.3 DCLevels and DCSets usage in PatternExec and Pattern blocks 10. DCLevels block <\/td>\n<\/tr>\n | ||||||
21<\/td>\n | 10.1 DCLevels block syntax <\/td>\n<\/tr>\n | ||||||
24<\/td>\n | 10.2 DCLevels block example <\/td>\n<\/tr>\n | ||||||
25<\/td>\n | 10.3 InheritDCLevels Processing 10.4 InheritDCLevels example <\/td>\n<\/tr>\n | ||||||
26<\/td>\n | 11. DCSets block 11.1 DCSets block syntax 11.2 DCSets statement example 12. DCSequence block <\/td>\n<\/tr>\n | ||||||
27<\/td>\n | 12.1 DCSequence block syntax <\/td>\n<\/tr>\n | ||||||
28<\/td>\n | 12.2 DCSequence example <\/td>\n<\/tr>\n | ||||||
30<\/td>\n | 13. Extensions to Clause 18, WaveformTable block 13.1 Event definition in WaveformTable block <\/td>\n<\/tr>\n | ||||||
31<\/td>\n | 13.2 Mapping of event integers to DCLevels statements <\/td>\n<\/tr>\n | ||||||
32<\/td>\n | 13.3 DC levels switching example <\/td>\n<\/tr>\n | ||||||
33<\/td>\n | 14. Extensions to Clause 22, STIL Pattern statements 14.1 DCLevels statement 14.2 DCLevels statement example <\/td>\n<\/tr>\n | ||||||
34<\/td>\n | Annex A – DCLevels and DCSets usage example <\/td>\n<\/tr>\n | ||||||
40<\/td>\n | Annex B – Bibliography <\/td>\n<\/tr>\n | ||||||
41<\/td>\n | Annex C – List of participants <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" IEC 62527 Ed. 1 (IEEE Std 1450.2(TM)-2002): Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification<\/b><\/p>\n |